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introduction_and_instrument_purpose

Introduction and Instrument Purpose

At FAIR and GSI several detectors are used. Those types of detectors are intercepting diagnostic devices for the determination of the beam profile. The relevant specification can be accessed here: https://edms.cern.ch/ui/#!master/navigator/document?D:1454844081:1454844081:subDocs.

introduction_and_instrument_purpose.txt · Last modified: 2018/12/06 12:09 by vschaefer