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The goal is to measure the capacitance of the detectors which are in use in the high energy beam lines as a fiction of frequency. This information can be used in to simulate detector response and for diagnostics of the detector health. For instance defect cables can be discovered by controlling the detector capacitance.
For S11 measurement, select NA and set Start F = 30 kHz, Stop F = 10 MHz
For all measurements perform quick calibration with SMA open and 50 Ohm load from the Nano-VNA set
Detector | F [kHz] | C [pF] | Θ [deg] |
---|---|---|---|
Ref.Cal. L=65cm | 0.100 | 66.1 | -89.0 |
0.120 | 67.2 | -89.7 | |
1 | 67.1 | -89.8 | |
10 | 67.0 | -80.0 | |
100 | 66.9 | -89.1 | |
FAIR-SEM | 0.100 | 124.8 | -89.8 |
0.120 | 124.8 | -89.8 | |
1 | 124.5 | -89.8 | |
10 | 124.1 | -80.0 | |
100 | 123.8 | -89.2 | |
FAIR-IC | 0.100 | 228 | |
0.120 | 227 | ||
1 | 226 | ||
10 | 225.8 | ||
100 | 223.3 | ||
BLM-IC | 0.100 | 428.5 | |
0.120 | 428.5 | ||
1 | 428.7 | ||
10 | 427.9 | ||
100 | 426.8 | ||
BLM-PC | 1 | 8 |