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projects:ipm-sis:more [2008/11/17 14:33] t.giacomini |
projects:ipm-sis:more [2010/02/01 22:14] (current) |
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Ein IPM (Ionisations Profil Monitor) wird verwendet um das Profil des Teilchenstrahls in Kreisbeschleunigern zu messen. Das Profil liefert Informationen, | Ein IPM (Ionisations Profil Monitor) wird verwendet um das Profil des Teilchenstrahls in Kreisbeschleunigern zu messen. Das Profil liefert Informationen, | ||
- | **[[System Description]]**, | + | **[[System Description]]**, |
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+ | System Description | ||
HV-System -> {{: | HV-System -> {{: | ||
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DAQ Data Acquisition -> {{: | DAQ Data Acquisition -> {{: | ||
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DAN Data Analysis -> {{: | DAN Data Analysis -> {{: | ||
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MCP Fast Switching | MCP Fast Switching | ||
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Magnetic Field -> {{: | Magnetic Field -> {{: | ||
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+ | {{: |